TEM (Transmission Electron Microscopes) Microscopes électroniques à transmission FEI’s market-leading TEMs feature fully integrated and automated operation for a range of applications requiring ultra-high resolution down to sub-?ngstrom levels. TEMs utilize very thin (0.5 µm or less) samples illuminated by an electron beam. Images are recorded by detecting the electrons that pass though the sample (similar to what happens with the light in a slide projector). These electrons pass through a system of electromagnetic lenses and are focused as an enlarged image on a fluorescent screen, a photographic film or a digital camera. Magnifications of more than 1 million times are attainable. FEI's Tools for Nanotech bring the nanoscale within the reach of researchers and developers who are working towards the biggest innovations of the 21st century. Our systems are developed to meet the rigorous technology roadmaps of our customers in the diverse markets we serve and deliver the specific enabling applications they require. Below you can view our entire listing of systems for NanoResearch, NanoElectronics and NanoBiology. http://www.feicompany.com/systems/index.aspx